The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2024
Filed:
Aug. 20, 2020
Henkel Ag & Co. Kgaa, Duesseldorf, DE;
Peter Kuhm, Hilden, DE;
Frank Krude, Duesseldorf, DE;
Christian Rosenkranz, Duesseldorf, DE;
Christian Stromberg, Duesseldorf, DE;
Christoph Waloch, Langenfeld, DE;
HENKEL AG & CO. KGAA, Duesseldorf, NY (US);
Abstract
A method and associated system for applying an optimized processing treatment to items in an industrial treatment line are described. First, settings for a value of a working parameter in the treatment line are defined. The settings are associated with value ranges of a parameter representative of an external property of items. Then, a value of the parameter representative of the external property of the item is measured. A setting for the value of the working parameter associated with a value range from the set of value ranges comprising the measured value is compared to the current setting of the working parameter. When a difference is detected between the associated setting and the current setting, the current setting is changed to the associated setting.