The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2024
Filed:
Apr. 16, 2020
Volume Graphics Gmbh, Heidelberg, DE;
Gerd Schwaderer, Heidelberg, DE;
Thomas Günther, Heidelberg, DE;
Johannes Fieres, Heidelberg, DE;
Matthias Flessner, Heidelberg, DE;
VOLUME GRAPHICS GMBH, Heidelberg, DE;
Abstract
Described is determining defects of an object produced using an additive manufacturing process, including: determining spatially resolved first data relating to n objects, the first data defines a process coordinate system for each of the n objects, determining measurement data relating to the n objects by imaging the n objects, the measurement data defines, for each of the n objects, an object representation in a measurement coordinate system, determining which coordinates of at least one section of the measurement coordinate system are defect coordinates assigned to a defect in the object representation; correlating the at least one section with a corresponding section of the process coordinate system in order to collect training data, training an adaptive algorithm for determining defect coordinates in spatially resolved data, by means of the training data, determining spatially resolved second data, and analysing the second data for defects by means of the adaptive algorithm.