The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2024

Filed:

Apr. 29, 2022
Applicant:

Ram Photonics Industrial, Llc, Webster, NY (US);

Inventor:

Joseph Lawson, Rochester, NY (US);

Assignee:

RAM Photonics Industrial, LLC, Webster, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 6/255 (2006.01); G02B 6/42 (2006.01);
U.S. Cl.
CPC ...
G02B 6/2555 (2013.01); G02B 6/4206 (2013.01); G02B 6/4214 (2013.01); G02B 6/4221 (2013.01); G02B 6/4227 (2013.01);
Abstract

Various embodiments and methods relating to an optical fiber curvature measurement system are described herein. The optical fiber curvature measurement system includes a controller and a rotation stage. The rotation stage includes a central axis, a first end, and a second end. The central axis extends from the first end to the second end of the rotation stage. The rotation stage includes an optical fiber channel extending from the first end of the rotation stage to the second end of the rotation stage. The rotation stage is operationally coupled with the controller and configured to rotate about the central axis of the rotation stage. An optical fiber may be positioned within the optical fiber channel. The optical fiber curvature measurement system also includes a light source positioned to emit light onto the optical fiber channel at an oblique angle from the central axis of the rotation stage.


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