The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2024

Filed:

May. 25, 2022
Applicant:

Shenzhen Institutes of Advanced Technology Chinese Academy of Sciences, Guangdong, CN;

Inventors:

Zhanli Hu, Guangdong, CN;

Yongfeng Yang, Guangdong, CN;

Chunhui Zhang, Guangdong, CN;

Zhonghua Kuang, Guangdong, CN;

Xiaohui Wang, Guangdong, CN;

San Wu, Guangdong, CN;

Dong Liang, Guangdong, CN;

Xin Liu, Guangdong, CN;

Hairong Zheng, Guangdong, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/29 (2006.01); A61B 6/00 (2024.01); A61B 6/03 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G01T 1/2985 (2013.01); A61B 6/037 (2013.01); A61B 6/5205 (2013.01); G06T 11/003 (2013.01);
Abstract

A method for processing positron emission tomography data is provided, this method includes: obtaining a first coordinate and a second coordinate respectively corresponding to two ends of a response line to be processed; determining corresponding dimensional coordinates of the response line to be processed in a sinogram based on the first coordinate and the second coordinate; and generating the sinogram corresponding to the response line to be processed based on the dimensional coordinates. According to this method, the amount of calculation of system matrix is reduced, the accuracy of position information of the generated response line is improved, and the accuracy of generated sinogram is improved accordingly.


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