The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2024
Filed:
Oct. 20, 2020
Applicant:
Koninklijke Philips N.v., Eindhoven, NL;
Inventors:
Steffen Weiss, Hamburg, DE;
Jan Hendrik Wuelbern, Hamburg, DE;
Christoph Günther Leussler, Hamburg, DE;
Julien Thomas Senegas, Hamburg, DE;
Assignee:
Koninklijke Philips N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/28 (2006.01); A61B 5/00 (2006.01); A61B 5/055 (2006.01); G01R 33/56 (2006.01); G02B 5/09 (2006.01);
U.S. Cl.
CPC ...
G01R 33/283 (2013.01); A61B 5/0077 (2013.01); A61B 5/055 (2013.01); G01R 33/56 (2013.01); G02B 5/09 (2013.01);
Abstract
A magnetic resonance examination system with an examination zone () and comprising a camera () and non-metallic mirror (), in particular within the examination zone (), arranging an optical pathway () between a portion of the examination zone (), via the non-metallic mirror (), and the camera (). The camera can obtain image information from that portion even if the direct line of sight () is blocked. The non-metallic mirror is a dielectric mirror having a macroscopically grated base.