The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2024
Filed:
Feb. 03, 2023
Microchip Technology Incorporated, Chandler, AZ (US);
David Roberts, Gilbert, AZ (US);
Jeremy Nall, Phoenix, AZ (US);
Kazi Naisur Rahman, Chandler, AZ (US);
Ray Nassim, Phoenix, AZ (US);
Microchip Technology Incorporated, Chandler, AZ (US);
Abstract
A system and method of testing an integrated circuit provide a first clock signal to a first flip-flop with an output to a functional circuit, provide a second clock signal to a second flip-flop with an input from the functional circuit, wherein the second flip-flip has a minimum hold time, provide a test input to the first flip-flop, observe a signal propagation time through the functional circuit, determine the signal propagation time is less than the minimum hold time of the second flip-flop, and increasing a timing separation by adding a unit of delay to the first clock signal or subtracting a unit of delay from the second clock signal.