The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2024
Filed:
May. 05, 2022
Ontario Die International Inc., Kitchener, CA;
Wesley Elton Scott, Kitchener, CA;
Darryl Neil Poworoznyk, Kitchener, CA;
Mandeep Singh Bhatia, In, CA;
Petr Piro, Kitchener, CA;
Paul Sajecki, Kitchener, CA;
Eliel Paul Amora, Kitchener, CA;
Trevor Sean Barnwell, Kitchener, CA;
Sebastian Mocny, Kitchener, CA;
Abstract
A die inspection station for generating an inspection report. The station includes a work surface to receive an entire cutting die thereon for inspection; a housing supporting the work surface; an image capture system supported by the housing above the work surface with an optical axis of the image capture system generally perpendicular to the work surface, the image capture system arranged to capture at least one image of the entire cutting edge of the cutting die; and an illumination source supported by the housing and arranged to illuminate the entire cutting edge at an oblique angle while the image capture system captures the at least one image.