The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2024
Filed:
Nov. 05, 2021
Applicant:
Sol Inc., Seoul, KR;
Inventor:
Jong Muk Lee, Seoul, KR;
Assignee:
SOL INC., Seoul, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/10 (2024.01); G01N 15/14 (2024.01); G01N 15/1433 (2024.01); G01N 15/1434 (2024.01); G06T 11/20 (2006.01); G01N 15/01 (2024.01);
U.S. Cl.
CPC ...
G01N 15/1433 (2024.01); G01N 15/1012 (2013.01); G01N 15/1434 (2013.01); G06T 11/206 (2013.01); G01N 15/01 (2024.01); G01N 2015/144 (2013.01); G01N 2015/1486 (2013.01);
Abstract
An image sensor package, a system, and a method for counting fine particles by using a virtual grid line are provided. The image sensor package includes an image sensor array, a grid pattern layer formed on an outer area of the image sensor array and including a plurality of protruding patterns spaced apart from each other while protruding toward the central area of the image sensor array to form a virtual grid line, a dam pattern layer formed on the grid pattern layer, having a specific height, and configured to form a channel or a chamber for receiving the fine particles to be counted, and a cover glass formed on the dam pattern layer.