The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2024
Filed:
Mar. 25, 2022
Topcon Corporation, Tokyo-to, JP;
Nobuyuki Nishita, Tokyo-to, JP;
TOPCON Corporation, Tokyo-to, JP;
Abstract
A surveying system comprises a target and a measuring instrument. The target has retro-reflection characteristics, the measuring instrument comprises a point measuring unit for irradiating a distance measuring light, for receiving a reflected light and for measuring three-dimensional coordinates of the target based on a light receiving result, a scanner unit for rotatably irradiating a laser beam and for acquiring the point cloud data and an arithmetic control module, wherein the point measuring unit measures the target held in the vicinity of an object, the arithmetic control module calculates a region of a three-dimensional space including the object based on a target measurement result of the point measuring unit, the scanner unit scans a predetermined range including the object and acquires the point cloud data, and the arithmetic control module selects the point cloud data only included in the region of the point cloud data.