The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2024
Filed:
Jul. 20, 2023
Amo Groningen B.v., Groningen, NL;
Mihai State, Groningen, NL;
Robert Rosen, Groningen, NL;
Sieger Meijer, Groningen, NL;
Aixa Alarcon Heredia, Gronignen, NL;
Carmen Canovas Vidal, Groningen, NL;
AMO Groningen B.V., Groningen, NL;
Abstract
Systems and methods for evaluating ND are described herein. An example method can include constructing a non-sequential (NSC) ray-tracing model of an eye with an ophthalmic lens, and modelling a light source and a detector. The detector can be configured to mimic a retina of the eye. The method can also include computing irradiance data using the light source, the NSC ray-tracing model, and the detector. Irradiance data can be computed for each of a plurality of pupil sizes. The method can further include evaluating ND by analyzing the respective irradiance data for each of the pupil sizes. Also described herein are methods for designing an ophthalmic lens edge that reduces the incidence of ND for a given ophthalmic lens by adjusting the edge thickness and/or the scatter.