The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2024

Filed:

Jun. 17, 2021
Applicant:

Arcam Ab, Mölnlycke, SE;

Inventor:

Anders Snis, Uddevalla, SE;

Assignee:

Arcam AB, Mölnlycke, SE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B22F 10/31 (2021.01); B22F 10/85 (2021.01); B22F 12/30 (2021.01); B22F 12/41 (2021.01); B22F 12/45 (2021.01); B22F 12/90 (2021.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01);
U.S. Cl.
CPC ...
B22F 10/31 (2021.01); B22F 10/85 (2021.01); B22F 12/30 (2021.01); B22F 12/41 (2021.01); B22F 12/45 (2021.01); B22F 12/90 (2021.01); B33Y 50/02 (2014.12); B33Y 30/00 (2014.12);
Abstract

Devices, systems and methods for calibrating and operating an additive manufacturing system are disclosed. A calibration system for an electron beam additive manufacturing system having a plurality of electron beam guns includes a calibration probe positioned in a build chamber of the electron beam additive manufacturing system, a sensing device positioned to measure and acquire a response generated as a result of impingement of electron beams emitted from the plurality of electron beam guns on the calibration probe, the sensing device generating a response signal as a result of the measured and acquired response, and an analysis component communicatively coupled to the sensing device and programmed to analyze and evaluate the response signal.


Find Patent Forward Citations

Loading…