The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2024
Filed:
Apr. 21, 2015
Applicant:
Rensselaer Polytechnic Institute, Troy, NY (US);
Inventors:
Ge Wang, Loudonville, NY (US);
Matthew Webber Getzin, Troy, NY (US);
Lars Arne Gjesteby, Cohasset, MA (US);
Wenxiang Cong, Albany, NY (US);
Assignee:
Rensselaer Polytechnic Institute, Troy, NY (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/48 (2006.01); A61B 5/00 (2006.01); A61B 5/055 (2006.01); A61B 6/03 (2006.01); A61K 49/04 (2006.01); A61K 49/08 (2006.01); A61K 49/18 (2006.01); G01R 33/56 (2006.01);
U.S. Cl.
CPC ...
A61K 49/1824 (2013.01); A61B 5/0035 (2013.01); A61B 5/0042 (2013.01); A61B 5/055 (2013.01); A61B 6/032 (2013.01); A61K 49/04 (2013.01); A61K 49/08 (2013.01); G01R 33/4812 (2013.01); G01R 33/5601 (2013.01);
Abstract
Imaging systems and methods are provided. Systems and methods of the subject invention can include the use of nanoparticles (for example, nanophosphors) within a sample to be imaged. Excitation with radiation, such X-ray radiation, can be performed on the nanoparticles to give rise to a change in one or more resonance parameters of the nanoparticles, and this change can be measured using magnetic resonance imaging to provide localization information.