The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2024
Filed:
Dec. 07, 2021
Shenzhen Mindray Bio-medical Electronics Co., Ltd., Guangdong, CN;
Shenzhen Second People's Hospital, Guangdong, CN;
Huifang Wang, Shenzhen, CN;
Yongquan Lai, Shenzhen, CN;
Yaoxian Zou, Shenzhen, CN;
Muqing Lin, Shenzhen, CN;
Zhijie Chen, Shenzhen, CN;
Shenzhen Mindray Bio-Medical Electronics Co., Ltd., Shenzhen, CN;
Shenzhen Second People's Hospital, Shenzhen, CN;
Abstract
A method for measuring parameters in an ultrasonic image, includes: obtaining an ultrasound image by receiving ultrasound echoes from a target tissue with an ultrasound probe and contains an area representing the target tissue; displaying the ultrasound image; obtaining multiple measurement items to be measured; determining multiple anatomical feature items whose positions are to be determined during a measurement of the multiple measurement items according to a relevance among the multiple measurement items, to obtain a feature set that comprises the multiple anatomical feature items and whose anatomical feature items are different from each other; determining positions of the anatomical feature items in the feature set in the ultrasound image; calculating values of the multiple measurement items according to the positions of the anatomical feature items in the feature set; and outputting the values of the multiple measurement items.