The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2024
Filed:
Dec. 30, 2021
Canon Kabushiki Kaisha, Tokyo, JP;
Shutaro Kunieda, Kanagawa, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
An apparatus appropriately corrects a defective pixel of a radiation image in a radiation imaging apparatus having a function of AEC, both when performing AEC and when not performing AEC, the apparatus selecting a defect map from a first image defect map in which a defective pixel (line), which is a group of defective linear pixels, is not included in a region of interest for detecting the dose of radiation in a pixel region in order to perform an AEC pertaining to stopping of irradiation of radiation, and a second image defect map in which a defective pixel (line) which is a group of defective linear pixels, is included in a region of interest, depending on whether or not an AEC is performed, and corrects the radiation image using the selected defect map.