The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2024

Filed:

Apr. 26, 2021
Applicants:

Wisconsin Alumni Research Foundation, Madison, WI (US);

Aiq Solutions, Inc., Madison, WI (US);

Inventors:

Robert Jeraj, Madison, WI (US);

Victor Fernandes, Madison, WI (US);

Timothy Perk, Madison, WI (US);

Peter Ferjancic, Madisn, WI (US);

Daniel Huff, Madison, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); G06T 7/00 (2017.01); G06T 7/38 (2017.01);
U.S. Cl.
CPC ...
A61B 5/4842 (2013.01); G06T 7/0016 (2013.01); G06T 7/38 (2017.01); G06T 2207/10104 (2013.01); G06T 2207/20212 (2013.01); G06T 2207/30096 (2013.01);
Abstract

A method and apparatus for tracking disease progression as revealed by multiple lesions perform a global optimization to identify corresponding lesions by overlap, for example, after outlines of the lesions have been morphologically dilated. A clustering algorithm addresses the problem of lesions separating into parts or joining together to provide a clear picture of disease progression.


Find Patent Forward Citations

Jeraj, Robert. (2024). System and method for monitoring multiple lesions (U.S. Patent No. 12150776). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12150776

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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