The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2024
Filed:
Jul. 17, 2023
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
George Themelis, Lindau, DE;
LEICA INSTRUMENTS (SINGAPORE) PTE. LTD., Singapore, SG;
Abstract
The present invention relates to a surgical microscope with a field of view and comprising an optical imaging system which images an inspection area which is at least partially located in the field of view, and to a method for a gesture control of a surgical microscope having an optical imaging system. The surgical microscope further comprises a gesture detection unit for detection of a movement of a surgical instrument, the gesture detection unit having a detection zone which is located between the inspection area and the optical imaging system and is spaced apart from the inspection area, and the gesture detection unit being configured to output a control signal to the optical imaging system depending on the movement of the surgical instrument in the detection zone, the optical imaging system being configured to alter its state depending on the control signal.