The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2024
Filed:
Mar. 26, 2019
Applicant:
Haag-streit Ag, Köniz, CH;
Inventors:
Claudio Dellagiacoma, Bern, CH;
Jörg Breitenstein, Zollikofen, CH;
Assignee:
Haag-Streit AG, Köniz, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/00 (2006.01); A61B 3/10 (2006.01); A61B 3/135 (2006.01); A61B 3/14 (2006.01);
U.S. Cl.
CPC ...
A61B 3/0083 (2013.01); A61B 3/0008 (2013.01); A61B 3/1005 (2013.01); A61B 3/135 (2013.01); A61B 3/14 (2013.01);
Abstract
In the device and method, the angle of incidence of slit light onto an eye to be examined is determined from its Purkinje reflection recorded in an image by measuring the offset from the reflection to the apex of the image of the cornea. In another embodiment, Purkinje reflections of light sources arranged around the optical axis of the microscope are correlated with a reference pattern of radial stripes in order to determine the offset between the optical axis and the apex of the eye.