The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2024
Filed:
Jun. 30, 2023
Alcon Inc., Fribourg, CH;
Max Hall, Bradenton, FL (US);
Thomas Padrick, Seattle, WA (US);
Edwin Jay Sarver, Cookeville, TN (US);
Alcon Inc., Fribourg, CH;
Abstract
Techniques are disclosed for systems and methods to provide improved ocular aberrometry recovery. An ocular aberrometry system includes a wavefront sensor configured to provide wavefront sensor data associated with an optical target monitored by the ocular aberrometry system and a logic device configured to communicate with the wavefront sensor. The logic device is configured to receive ocular aberrometry output data including at least the wavefront sensor data provided by the wavefront sensor, identify imaging artifact induced singularities in the received ocular aberrometry output data, determine corrected aberrometry output data based, at least in part, on the identified singularities and the received ocular aberrometry output data, and generate user feedback corresponding to the received ocular aberrometry output data based, at least in part, on the corrected aberrometry output data.