The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2024
Filed:
Dec. 02, 2021
City University of Hong Kong, Hong Kong, HK;
Yixuan Yuan, Hong Kong, HK;
Xiaochun Mai, Hong Kong, HK;
City University of Hong Kong, Hong Kong, HK;
Abstract
A method for performing a crop yield estimation using a semi-supervised deep convolution neural network is provided. The method includes receiving monitoring data from a drone, wherein the monitoring data comprises a video of the crops captured by the drone; sampling the video by a predefined frame rate to obtain one or more images; inputting the images to a crop yield estimation model to obtain one or more result data, wherein the crop yield estimation model comprises a generator and a discriminator each comprising one or more DCNNs, and wherein the crop yield estimation model is trained by a semi-supervised learning method; and performing a quantity estimation and a quality estimation corresponding to the crops as shown in the images according to the one or more result data, so as to determine a total number and maturities of the crops respectively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile