The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2024

Filed:

Sep. 27, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Hirofumi Ueda, Tokyo, JP;

Yoshinobu Ohta, Tokyo, JP;

Tomohiko Yagyu, Tokyo, JP;

Norio Yamagaki, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01); H04L 9/40 (2022.01);
U.S. Cl.
CPC ...
H04L 63/1433 (2013.01); G06F 21/57 (2013.01);
Abstract

Provided is an analysis system that allows a security administrator to understand the impact of known vulnerabilities on the system to be diagnosed. The topology identification unitidentifies network topology of devices included in a system to be diagnosed. The analysis unitgenerates an attack pattern that includes an attack condition, an attack result, an attack means that is vulnerability that is used by an attack, and a segment where the attack can occur in the system to be diagnosed. The display control unitdisplays segments included in attack patterns superimposed on the network topology, on a display device. At this time, the display control unitchanges a display mode of the segment according to a type of the vulnerability that corresponds to the attack means included in the attack pattern including the segment.


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