The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2024
Filed:
Feb. 01, 2023
Qualcomm Incorporated, San Diego, CA (US);
Gaurav Verma, San Diego, CA (US);
David Collins, Del Mar, CA (US);
Ryan Reddy Wendlandt, San Diego, CA (US);
Prachi Deshpande, San Diego, CA (US);
Gaurav Singhania, San Diego, CA (US);
Karthik Moncombu Ramakrishnan, Chennai, IN;
Jeffrey Carr, San Diego, CA (US);
Anushruti Bhattacharya, San Diego, CA (US);
Dennis Feenaghty, Solana Beach, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Methods and systems for automated testing of extremely-high frequency devices are disclosed. A device under test (DUT) is set in a simultaneous transmit and receive mode. The DUT receives a lower frequency radio frequency (RF) signal from a test unit and up-converts the lower frequency RF signal to a higher frequency RF signal. The DUT transmits the higher frequency RF signal using a first antenna, and receives the higher frequency RF signal using a second antenna. The DUT down-converts the received higher frequency RF signal to a received test RF signal and provides the received test RF signal to the test unit for comparing measurements derived from the received test signal to a design specification for the DUT.