The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2024

Filed:

Apr. 29, 2022
Applicant:

Schweitzer Engineering Laboratories, Inc., Pullman, WA (US);

Inventors:

Ellery A. Blood, Moscow, ID (US);

Scott M. Manson, Moscow, ID (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02J 3/00 (2006.01); H02J 3/32 (2006.01);
U.S. Cl.
CPC ...
H02J 3/003 (2020.01); H02J 3/322 (2020.01);
Abstract

This disclosure discusses systems, methods, and techniques for producing and utilizing a capability region of one or more monitored equipment. To do so, an intelligent electronic device (IED) may access a data set of one or more known performance characteristics of the monitored equipment. The known performance characteristics are based on, or dependent of, one or more variables. The IED may also access a constraint library with geometric primitives. Then, the IED may analyze the data set and may produce the capability region using the geometric primitive. The IED may compare an operating point of the monitored equipment to the capability region of the monitored equipment. Based on the comparison, the IED may implement a control action.


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