The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2024

Filed:

Sep. 09, 2022
Applicant:

SK Hynix Inc., Icheon-si, KR;

Inventor:

Yeong Han Jeong, Icheon-si, KR;

Assignee:

SK hynix Inc., Icheon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/06 (2006.01); G11C 29/18 (2006.01); G11C 29/42 (2006.01); G11C 29/44 (2006.01);
U.S. Cl.
CPC ...
G11C 29/42 (2013.01); G11C 29/18 (2013.01); G11C 29/44 (2013.01);
Abstract

A semiconductor system includes a controller configured to output parity information that includes an expected value at which an error correction code (ECC) encoding operation has been performed on an address in a test mode of a semiconductor device and configured to receive failure information. The semiconductor system also includes the semiconductor device configured to store an internal parity generated by performing the ECC encoding operation on the address that is input in a normal mode of the semiconductor device and configured to output the failure information generated by comparing the parity information and an output parity generated from the internal parity that is stored in the semiconductor device in the test mode.


Find Patent Forward Citations

Jeong, Yeong. (2024). Semiconductor device and semiconductor system for detecting an error occurred in a parity (U.S. Patent No. 12148492). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12148492

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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