The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2024

Filed:

Apr. 13, 2022
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Anselm Grundhoefer, Campbell, CA (US);

Arun Srivatsan Rangaprasad, Sunnyvale, CA (US);

Shubham Agrawal, Sunnyvale, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/764 (2022.01); G06T 5/70 (2024.01); G06V 10/20 (2022.01);
U.S. Cl.
CPC ...
G06V 10/764 (2022.01); G06T 5/70 (2024.01); G06V 10/255 (2022.01);
Abstract

Various implementations disclosed herein assess the blurriness of portions of images depicting shapes such as codes or text that have known structural elements. This may involve determining whether a portion of an image of a code or text is sufficiently clear (not blurry) to be accurately interpreted. Blur may be assessed based on spatial frequency of statistical analysis. Blur may be assessed using a machine learning model that is trained using target blur metrics determined based on spatial frequency (e.g., analysis of high frequency portions of discrete cosine transforms of image portions) or statistical analysis (e.g., based on corner/edge detection in image portions).


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