The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2024
Filed:
Mar. 27, 2019
Product-inspection apparatus, product-inspection method, and non-transitory computer readable medium
Nec Corporation, Tokyo, JP;
Keiko Inoue, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
A product-inspection apparatus capable of contributing to the improvement in the efficiency of product-inspections of objects to be inspected is provided. A product-inspection apparatus includes a mirror including a first reflection part on a side surface of a first projecting part having a tapered shape, a first imaging unit configured to take images of a plurality of objects to be inspected arranged around the first reflection part through the first reflection part, a light source configured to apply light to the objects to be inspected, and a determination unit configured to determine whether or not the object to be inspected is a quality product based on image information taken by the first imaging unit.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile