The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2024
Filed:
Feb. 14, 2022
Joseph Stephen Indeck, Huntsville, AL (US);
Kavan Hazeli, Tucson, AZ (US);
Jesus O. Mares, Mary Esther, FL (US);
Joseph Stephen Indeck, Huntsville, AL (US);
Kavan Hazeli, Tucson, AZ (US);
Jesus O. Mares, Mary Esther, FL (US);
Board of Trustees for the University of Alabama, for and on behalf of the University of Alabama in Huntsville, Huntsville, AL (US);
Government of the United States as represented by the Secretary of the Air Force, Wright-Patterson AFB, OH (US);
Abstract
An image processing system receives a digital image and analyzes the digital image to determine a resolution limit, referred to herein as 'feature resolution,' for measuring a metric for features of the image within an acceptable margin of error. Specifically, the system segments a digital image and calculates the error associated with the segmented data when features within a certain range a measured metric (e.g., size range) are removed from the segmented data. This analysis can be repeatedly performed with different cutoff values for the metric until at least a threshold amount of error is reached, thereby indicating a resolution limit at the boundary of an acceptable amount of error.