The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2024
Filed:
Apr. 26, 2021
Localization-based test generation for individual fairness testing of artificial intelligence models
International Business Machines Corporation, Armonk, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Methods, systems, and computer program products for localization-based test generation for individual fairness testing of AI models are provided herein. A computer-implemented method includes obtaining at least one artificial intelligence model and training data related to the at least one artificial intelligence model; identifying one or more boundary regions associated with the at least one artificial intelligence model based at least in part on results of processing at least a portion of the training data using the at least one artificial model; generating, in accordance with at least one of the one or more identified boundary regions, one or more synthetic data points for inclusion with the training data; and executing one or more fairness tests on the at least one artificial intelligence model using at least a portion of the one or more generated synthetic data points and at least a portion of the training data.