The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2024

Filed:

Feb. 10, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Sungun Park, Suwon-si, KR;

Kyuhong Kim, Seoul, KR;

Jaejoon Han, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/32 (2013.01); G06V 10/74 (2022.01); G06V 10/82 (2022.01); G06V 40/12 (2022.01); G06V 40/40 (2022.01); G06V 40/50 (2022.01);
U.S. Cl.
CPC ...
G06F 21/32 (2013.01); G06V 10/761 (2022.01); G06V 10/82 (2022.01); G06V 40/1365 (2022.01); G06V 40/1388 (2022.01); G06V 40/45 (2022.01); G06V 40/50 (2022.01);
Abstract

An anti-spoofing method includes detecting first information related to whether the biometric information is forged, based on a first output vector of a first neural network configured to detect whether the biometric information is forged from the input data, extracting an input embedding vector including a feature of biometric information of a user from input data including the biometric information, calculating a similarity value of the input embedding vector based on a fake embedding vector and either one or both of a real embedding vector and an enrollment embedding vector that are provided in advance, calculating a total forgery score based on the similarity value and a second output vector of the first neural network according to whether the first information is detected, and detecting second information related to whether the biometric information is forged, based on the total forgery score.


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