The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2024
Filed:
Sep. 22, 2021
International Business Machines Corporation, Armonk, NY (US);
Xue Rui Hu, Beijing, CN;
Wang Liu, Beijing, CN;
Meng Wan, Beijing, CN;
Mei Qin Si, Beijing, CN;
Li Na Guo, Beijing, CN;
Hong Yan Zhang, Beijing, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
In an approach for smart test data workload generation, a processor receives a plurality of expected image frames for a user interface application to be tested. The plurality of expected image frames is pre-defined and represents a series of workflows and operations of the user interface application to be expected based on a design requirement. A processor calculates a first set of hash-values for each corresponding expected image frame. A processor samples the user interface application with a frequency to a plurality of testing image frames during a test run on the user interface application. A processor calculates a second set of hash-values for each sampled testing image frame. A processor compares the first set of hash-values to the second set of hash-values. A processor verifies that the second set of hash-values matches the first set of hash-values.