The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2024

Filed:

Jan. 31, 2023
Applicant:

Newphotonics Ltd., Kfar-Mordechai, IL;

Inventors:

Yosef Ben Ezra, Petah Tikva, IL;

Yaniv Ben Haim, Kfar-Mordehai, IL;

Assignee:

NEWPHOTONICS LTD., Kfar Mordechai, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/025 (2006.01);
U.S. Cl.
CPC ...
G02F 1/025 (2013.01); G02F 2201/58 (2013.01);
Abstract

A device and methods, the device comprising: a photo detector comprising a waveguide; two metal layers connected to the photo detector; a measurement device connected between the two metal layers, for measuring an electric parameter between the two metal layers, said electric parameter indicative of an amount of light propagating through the waveguide; and a voltage source connected between the two metal layers, wherein applying voltage between the two metal layers changes a refraction index of the waveguide, thereby affecting a phase of light propagating through the waveguide, and wherein the voltage to be applied is determined in accordance with the resistance measured by the resistance measurement device.


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