The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2024

Filed:

Aug. 21, 2023
Applicant:

3d AT Depth, Inc., Longmont, CO (US);

Inventors:

Carl W. Embry, Boulder, CO (US);

Neil Manning, Katy, TX (US);

Ian Roberts, Houston, TX (US);

Assignee:

3D AT DEPTH, INC., Longmont, CO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 15/87 (2006.01); B63G 8/00 (2006.01); B63G 8/38 (2006.01); G01C 13/00 (2006.01); G01C 21/20 (2006.01); G01S 15/74 (2006.01); G01S 15/86 (2020.01); G01S 17/42 (2006.01); G01S 17/74 (2006.01); G01S 17/86 (2020.01); G01S 17/88 (2006.01); G01S 17/93 (2020.01);
U.S. Cl.
CPC ...
G01S 15/874 (2013.01); B63G 8/001 (2013.01); B63G 8/38 (2013.01); G01C 13/00 (2013.01); G01C 21/20 (2013.01); G01S 15/74 (2013.01); G01S 15/86 (2020.01); G01S 15/87 (2013.01); G01S 17/42 (2013.01); G01S 17/86 (2020.01); G01S 17/88 (2013.01); G01S 17/93 (2013.01); B63G 2008/005 (2013.01); G01S 17/74 (2013.01);
Abstract

Described herein are methods and devices for improved location of any and all underwater structures or equipment installed underwater. In particular, systems are disclosed that combine optical and acoustic metrology for locating objects in underwater environments. The systems allow for relative positions of objects to be determined with great accuracy using optical techniques, and support enhanced location of devices that utilize acoustic location techniques. In addition, location information can be provided by the system even in conditions that make optical metrology techniques impossible or impractical.


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