The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2024
Filed:
Oct. 22, 2021
Keysight Technologies, Inc., Santa Rosa, CA (US);
Ian Reading, Edinburgh, GB;
Paul Duncan, Glasgow, GB;
Eric Breakenridge, Clackmannanshire, GB;
Colin M. Arthur, Edinburgh, GB;
KEYSIGHT TECHNOLOGIES, INC., Santa Rosa, CA (US);
Abstract
An instrument for measuring a physical quantity, an instrument system having a plurality of such instruments, and a method for operating such a system are described. The instrument includes a sensor, an instrument class error calculator and a communication interface. The sensor measures the physical quantity and generates a value, Vm, for the physical quantity. The instrument class error calculator provides an instrument class error associated with Vm. The instrument system includes a plurality of these instruments that are manufactured on an ongoing basis. The instrument system includes a database that stores a measurement generated by each instrument in a sample of the instruments during manufacture and a communication link between the database and one of the instruments in the class that provides information on the instruments based on measurements made after the one of the instruments in the class was manufactured.