The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2024
Filed:
Apr. 15, 2019
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Mitsubishi Heavy Industries Machinery Systems, Ltd., Kobe, JP;
Kazuhiro Ueshiro, Hyogo, JP;
Mitsuyoshi Uematsu, Tokyo, JP;
Hiroshi Takemoto, Tokyo, JP;
Yuki Tokita, Tokyo, JP;
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
MITSUBISHI HEAVY INDUSTRIES MACHINERY SYSTEMS, LTD., Kobe, JP;
Abstract
An ultrasonic flaw detection device comprises a flaw detection unit for transmitting and receiving ultrasound, a swinging mechanism for supporting the flaw detection unit to swing around a swinging axis, and a locking mechanism for switching between a swinging state and a locked state. The ultrasonic flaw detection device controls the locking mechanism and swinging mechanism such that when the flaw detection unit is moved along a direction tangential to a surface to be inspected from a position removed from a first end part of the surface to be inspected to a lock release position, the flaw detection unit is put in the locked state such that a direction tangential to a contact surface and the direction tangential to the surface to be inspected coincide, and the flaw detection unit is switched from the locked state to the swinging state after the flaw detection unit reaches the lock release position.