The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2024
Filed:
Jan. 21, 2021
Hamamatsu Photonics K.k., Hamamatsu, JP;
Naoki Iwata, Hamamatsu, JP;
Fusanori Kondo, Hamamatsu, JP;
Tomokazu Matsumura, Hamamatsu, JP;
Teruo Takeshita, Hamamatsu, JP;
HAMAMATSU PHOTONICS K.K., Hamamatsu, JP;
Abstract
An optical measurement device includes an irradiation optical system, a detection optical system, and a cancel circuit. In a fluorescence detection process, a sample is designated as an irradiation target, the sample is irradiated with irradiation light, measurement target light including fluorescence generated from the sample irradiated with the irradiation light and light scattered from the sample irradiated with the irradiation light is detected as detection light, a signal component corresponding to the scattered light is removed from a measurement signal corresponding to the measurement target light in consideration of a result of performing a calibration process during a preliminary process. In the preliminary process, the calibration process for removing a signal component corresponding to the scattered light from the measurement signal is performed on the basis of a calibration signal having a higher signal intensity than a signal corresponding to the scattered light in the measurement signal.