The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2024
Filed:
May. 26, 2020
Applicant:
Sony Group Corporation, Tokyo, JP;
Inventor:
Yoshiki Okamoto, Tokyo, JP;
Assignee:
SONY GROUP CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2024.01); G01N 15/1433 (2024.01); G01N 15/1434 (2024.01); H04N 25/77 (2023.01);
U.S. Cl.
CPC ...
G01N 15/1434 (2013.01); G01N 15/1433 (2024.01); G01N 15/1459 (2013.01); H04N 25/77 (2023.01); G01N 2015/1445 (2013.01);
Abstract
There is provided an optical measuring device according to an embodiment which includes a spectroscopic optical system that spectrally disperses a fluorescent ray emitted from a specimen that passes through each of a plurality of irradiation spots arrayed in a first direction in a second direction included in a plane parallel to the first direction and an image sensor that receives the fluorescent ray spectrally dispersed by the spectroscopic optical system and generates image data. The second direction is inclined with respect to a plane vertical to the first direction.