The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2024
Filed:
Mar. 17, 2020
Hitachi High-tech Corporation, Tokyo, JP;
Hitachi High-Tech Corporation, Tokyo, JP;
Abstract
Provided is a particle quantitative measurement device according to which the number of particles that can be accurately recognized in a particulate sample has a wider range. An observation devicecomprises a computerand an imaging camerafor acquiring a sample image representing the particulate sample. As an extraction unit, the computerextracts a low-brightness pixel for which I<M−kσ is satisfied for brightness I from pixels of the sample image. Here, M represents brightness for a reference image, k represents a real positive number, and σ represents a standard deviation for the brightnesses of the pixels in the reference image. The computeralso functions as a particle recognition unit or a particle quantitative measurement unit and quantitatively measures the particulate sample on the basis of the low-brightness pixel.