The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2024
Filed:
Dec. 16, 2021
Rebellion Photonics, Inc., Houston, TX (US);
Patrick Charles O'Driscoll, Houston, TX (US);
Reza Katebi, Decatur, GA (US);
Mohammad Lotfollahi Sohi, Houston, TX (US);
Chuan Zhao, Sugar Land, TX (US);
Quan Shen, Houston, TX (US);
Xiaodan Ma, Houston, TX (US);
Amirhossein Rafati, Alpharetta, GA (US);
Bo Fu, Zhongshan, CN;
Jaehoon Lee, Houston, TX (US);
Rebellion Photonics, Inc., Houston, TX (US);
Abstract
Systems, methods, and computer program products for fugitive emission determinations are provided. An example imaging system includes a first infrared (IR) imaging device configured to generate first IR image data of a field of view of the first IR imaging device that include one or more data entries associated with a fugitive emission from an emission source. The system further includes a computing device operably connected with the first IR imaging device and configured to receive the first IR image data from the first IR imaging device, generate spectral absorption data based on the first IR image data, and determine a gas amount associated with the fugitive emission based upon the spectral absorption data. The computing device also determines a leak rate and leak duration of the fugitive emission based upon the determined gas amount and determines a total emission loss based on the same.