The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2024

Filed:

May. 17, 2021
Applicant:

Rosemount Aerospace Inc., Burnsville, MN (US);

Inventors:

Daniel Hanson, Shakopee, MN (US);

Richard Alan Schwartz, Faribault, MN (US);

Assignee:

Rosemount Aerospace Inc., Burnsville, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 10/40 (2022.01); G01J 5/00 (2022.01); G01J 5/02 (2022.01); G06T 7/00 (2017.01); G06V 10/22 (2022.01); G06V 10/75 (2022.01); H04N 5/33 (2023.01);
U.S. Cl.
CPC ...
G01J 5/0096 (2013.01); G01J 5/025 (2013.01); G06T 7/001 (2013.01); G06V 10/22 (2022.01); G06V 10/40 (2022.01); G06V 10/758 (2022.01); H04N 5/33 (2013.01); G01J 2005/0077 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/30164 (2013.01);
Abstract

An apparatus and method for inspecting articles incorporating positive temperature coefficient resistors. The inspection apparatus includes a computing device, a power source, a housing, a support, and a thermal imager, each mounted within an interior volume of the housing. The inspection method includes receiving a first thermal image of the unpowered article mounted within the support and receiving a second thermal image of the powered article after an optimized time delay. The method further includes outputting a health indication of the positive temperature coefficient resistors based on a comparison of the first thermal image and the second thermal image.


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