The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2024

Filed:

Dec. 15, 2023
Applicant:

Topcon Corporation, Tokyo, JP;

Inventors:

Xiang Wei, San Jose, CA (US);

Tony Ko, Cupertino, CA (US);

Assignee:

TOPCON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/453 (2006.01); G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
G01J 3/453 (2013.01); G01J 3/2823 (2013.01); G01J 2003/4538 (2013.01);
Abstract

A full-range imaging method doubles imaging range of conventional techniques by removing mirror images of an imaged object that limit conventional images to a 'half-range' and that are caused in part by the loss of phase information in a detected signal. Phase information of the detected signal is reconstructed with an averaging technique based on a modulated phase induced in the detected signal during scanning.


Find Patent Forward Citations

Wei, Xiang. (2024). Enhanced full range optical coherence tomography (U.S. Patent No. 12146792). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12146792

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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