The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2024

Filed:

Sep. 10, 2020
Applicant:

Lawrence Livermore National Security, Llc, Livermore, CA (US);

Inventors:

Richard H. Gee, Livermore, CA (US);

Amitesh Maiti, San Ramon, CA (US);

Henry E. Reinstein, Livermore, CA (US);

Alexander David Wilson, Danville, CA (US);

Peter J. Zischka, Livermore, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 1/36 (2006.01); G01F 1/88 (2006.01); G01N 15/02 (2024.01); G01N 15/08 (2006.01); G06F 17/11 (2006.01);
U.S. Cl.
CPC ...
G01F 1/363 (2013.01); G01F 1/88 (2013.01); G01N 15/02 (2013.01); G01N 15/082 (2013.01); G06F 17/11 (2013.01);
Abstract

A system for determining particle size of a quantity of a sample material contained in a sample material holder is disclosed, where the sample material is made up a plurality of the particles. The system may incorporate a pressure regulating subsystem for receiving a first pressurized airflow signal and regulating the first pressurized airflow signal to a second pressurized airflow signal having a pressure lower than the first pressurized airflow signal, the second pressurized airflow signal configured to be input to a first end of the sample material holder. A mass airflow transducer may be incorporated for determining a flow rate representing an air flow value entering the sample material holder. A control module uses the air flow value in combination with the pressure differential value and mathematically determining a dimension of the particles making up the sample material.


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