The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2024
Filed:
Sep. 19, 2018
Siemens Aktiengesellschaft, Munich, DE;
Felix Buggenthin, Munich, DE;
Siegmund Düll, Munich, DE;
Mitchell Joblin, Munich, DE;
Clemens Otte, Munich, DE;
Axel Reitinger, Munich, DE;
Victor Balanica, Ingolstadt, DE;
Michael Caelers, Norrköping, SE;
Jonas Eriksson, Finspong, SE;
Jerry Fornander, Finspong, SE;
Andreas Graichen, Finspang, SE;
Vincent Sidenvall, Örkelljunga, SE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
An apparatus and method for monitoring a quality of an object of a 3D-print job series of identical objects, each object built from a multitude of stacked 2D-layers printed by a 3D-printer in an additive manufacturing process, including: determining a layer quality indicator of a currently printed layer of an object, comparing the determined layer quality indicator of the currently printed layer with a predetermined lower confidence limit of the layer, the predetermined lower confidence limit being calculated depending on layer quality indicators of previously completely manufactured objects complying with predefined quality requirements, and generating a warning signal, if the layer quality indicator of the currently printed layer has a value equal or lower than the lower quality limit is provided.