The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2024

Filed:

May. 18, 2022
Applicant:

Tela Bio, Inc., Malvern, PA (US);

Inventors:

Skott Greenhalgh, Gladwyne, PA (US);

John-Paul Romano, Chalfont, PA (US);

Assignee:

TELA Bio, Inc., Malvern, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61F 2/00 (2006.01); A61L 31/00 (2006.01); A61L 31/04 (2006.01); A61L 31/14 (2006.01); D05B 93/00 (2006.01); D05C 17/00 (2006.01);
U.S. Cl.
CPC ...
A61F 2/0063 (2013.01); A61F 2/00 (2013.01); A61L 31/005 (2013.01); A61L 31/048 (2013.01); A61L 31/146 (2013.01); D05B 93/00 (2013.01); D05C 17/00 (2013.01); A61F 2002/0068 (2013.01); A61F 2210/0004 (2013.01); A61F 2210/0057 (2013.01); A61F 2210/0076 (2013.01); A61F 2250/0018 (2013.01); A61F 2250/0028 (2013.01); A61F 2250/0029 (2013.01); A61F 2250/003 (2013.01); A61L 2430/34 (2013.01);
Abstract

Compliance control stitch patterns sewn or embroidered into biotextile or medical textile substrates impart reinforcing strength, and stretch resistance and control into such substrates. Compliance control stitch patterns may be customizable to particular patients, substrate implantation sites, particular degenerative or diseased conditions, or desired time frames. Substrates having compliance control stitch patterns sewn or embroidered into them may be used in tissue repair or tissue reconstruction applications.


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