The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2024

Filed:

Oct. 04, 2022
Applicant:

Fujifilm Healthcare Corporation, Kashiwa, JP;

Inventor:

Kazuma Yokoi, Kashiwa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2024.01); A61B 6/03 (2006.01); A61B 6/58 (2024.01); G01N 23/046 (2018.01);
U.S. Cl.
CPC ...
A61B 6/032 (2013.01); A61B 6/582 (2013.01); G01N 23/046 (2013.01);
Abstract

An X-ray CT apparatus and a correction method of projection data that are capable of suppressing artifacts generated in the vicinity of an edge portion of a test subject are provided. The X-ray CT apparatus for photographing a test subject is characterized by comprising: a correction data creation unit that creates correction data using difference data between measurement projection data for each X-ray energy obtained by photographing a known phantom having a known composition, a known shape, and a size smaller than a photographing field of view of the X-ray CT apparatus and calculation projection data for each X-ray energy calculated on the basis of X-ray transmission lengths obtained from the shape of the known phantom; and a correction unit that corrects projection data for each X-ray energy of the test subject using the correction data.


Find Patent Forward Citations

Yokoi, Kazuma. (2024). X-ray ct apparatus and correction method of projection data (U.S. Patent No. 12144663). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12144663

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