The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2024
Filed:
Mar. 03, 2021
Mitsubishi Electric Corporation, Tokyo, JP;
MITSUBISHI ELECTRIC CORPORATION, Tokyo, JP;
Abstract
A component measurement device for measuring a given component contained in a sample. The component measurement device includes an excitation light source to emit excitation light onto the optical medium portion, a probe light source to emit probe light onto the optical medium portion, an intensity modulation unit to perform intensity modulation on the excitation light emitted by the excitation light source based on stratum corneum information about stratum corneum of the sample to generate intensity-modulated excitation light and emit the generated intensity-modulated excitation light onto the optical medium portion, and a measurement unit to measure the given component based on a difference between the probe light emitted from the optical medium portion in a first state where the excitation light is emitted and the probe light emitted from the optical medium portion in a second state where the intensity-modulated excitation light is emitted.