The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2024

Filed:

Oct. 02, 2020
Applicant:

Sharp Kabushiki Kaisha, Sakai, JP;

Inventors:

Liqing Liu, Sakai, JP;

Shohei Yamada, Sakai, JP;

Hiroki Takahashi, Sakai, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/08 (2009.01); H04L 27/26 (2006.01); H04W 72/0446 (2023.01); H04W 72/23 (2023.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); H04L 27/26025 (2021.01); H04L 27/2605 (2013.01); H04W 72/0446 (2013.01); H04W 72/23 (2023.01);
Abstract

A method by a user equipment (UE) is described. The method includes transmitting, to a base station, a capability to indicate multiple combinations (X, Y) for PDCCH monitoring, each combination (X, Y) is associated with a respective maximum number of monitored PDCCH candidates, determining spans in which PDCCH is monitored, and each span is a number of consecutive OFDM symbols up to Y, determining, from the multiple combinations (X, Y), one or more combinations (X, Y) in which the value of X is equal to or less than the minimum value of the gap separation of every two consecutive spans, determining, from the one or more combinations (X, Y), a combination (X, Y) with a larger maximum number of monitored PDCCH candidates for PDCCH monitoring.


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