The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2024

Filed:

Sep. 22, 2021
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Atsushi Kandori, Kanagawa, JP;

Kazuyuki Shigeta, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/265 (2006.01); H04N 23/45 (2023.01); H04N 23/80 (2023.01);
U.S. Cl.
CPC ...
H04N 5/265 (2013.01); H04N 23/45 (2023.01); H04N 23/80 (2023.01);
Abstract

An imaging apparatus includes a first image sensor for receiving light of a first wave range, a second image sensor for receiving light of a second wave range other than the first wave range, an information acquisition unit for acquiring position information relating to the imaging apparatus and environment information relating to an imaging environment of the imaging apparatus, an estimation unit for estimating, for each subject to be imaged by the imaging apparatus, influence of an external factor of the imaging apparatus on a first image, which is obtained from the first image sensor, by using the position information and the environment information that are acquired by the information acquisition unit, and an image synthesis unit configured to synthesize the first image and a second image, which is obtained from the second image sensor, on the basis of the influence estimated by the estimation unit.


Find Patent Forward Citations

Loading…