The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2024
Filed:
Jan. 19, 2023
Canon Kabushiki Kaisha, Tokyo, JP;
Reiji Misawa, Chiba, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
An inspection apparatus inspects image data obtained by reading a sheet using a reference image of the image data. The inspection apparatus obtains first image data by reading a sheet having lines printed thereon, obtains second image data from print data of the lines, performs edge correction on the lines included in the second image data by applying a plurality of edge correction parameters being different from each other, and determines an edge correction parameter of the plurality of edge correction parameters that minimizes a difference between a density of the second image data subjected to the edge correction and a density of the first image data. In addition, edge correction is performed on the reference image using the determined edge correction parameter, and image data obtained by reading a sheet of an inspection target using the reference image on which the edge correction has been performed is inspected.