The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2024
Filed:
Mar. 08, 2023
Wenzhou University, Zhejiang, CN;
Pengjun Wang, Zhejiang, CN;
Ziyu Zhou, Zhejiang, CN;
Hao Ye, Zhejiang, CN;
Yijian Shi, Zhejiang, CN;
Wenzhou University, Zhejiang, CN;
Abstract
The invention discloses a challenge screening method for improving the stability of a strong Physical Unclonable Function (PUF). If the stability of the group of challenges (GOCs) is quantized by 1 or 0, the GOCs are defined as stable challenges or unstable challenges respectively; the GOCs and the stability of corresponding responses are defined as a challenge-stability pair (CSP); a machining learning training dataset is constructed through CSPs for obtaining a screening model, to associate the challenge stability with the screening model; during actual application of the strong PUF, the challenge stability of a strong PUF is determined through the screening model, and stable challenges of the strong PUF are screened out to form a stable challenge set, which is input into the strong PUF to extract identity information. The challenge screening method can effectively improve the stability of various strong PUFs and has better effect with external disturbance increasing.