The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2024

Filed:

Sep. 26, 2022
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Debasish Mandal, Bengaluru, IN;

Vineeth Reddy Surendra, Austin, TX (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 9/40 (2022.01); G06F 9/445 (2018.01);
U.S. Cl.
CPC ...
H04L 63/1433 (2013.01); G06F 9/44526 (2013.01);
Abstract

Systems and techniques for detecting vulnerabilities and exploits within network assets in a near real-time manner. The systems provide for scanning and probing assets within an organization network based on determined or disclosed exploits from the wild. The system provides for digital risk protection that actively and passively hunts for potential organizational threats and vulnerabilities and generates alerts in real-time related to the detected exploits. The systems provide a platform for generating plugins to scan for the detected exploits and fingerprint assets for services hosted and potential vulnerabilities.


Find Patent Forward Citations

Mandal, Debasish. (2024). Large scale asset evaluation and probing (U.S. Patent No. 12143415). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12143415

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…