The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2024

Filed:

Mar. 18, 2021
Applicants:

Nec Corporation, Tokyo, JP;

The University of Electro-communications, Chofu, JP;

Inventors:

Masatsugu Ichino, Chofu, JP;

Daisuke Uenoyama, Chofu, JP;

Tsubasa Boura, Chofu, JP;

Takahiro Toizumi, Tokyo, JP;

Masato Tsukada, Tokyo, JP;

Yuka Ogino, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 40/18 (2022.01); G06T 3/40 (2006.01); G06V 10/77 (2022.01); G06V 10/774 (2022.01); G06V 10/776 (2022.01);
U.S. Cl.
CPC ...
G06V 40/193 (2022.01); G06T 3/40 (2013.01); G06V 10/7715 (2022.01); G06V 10/774 (2022.01); G06V 10/776 (2022.01);
Abstract

A feature conversion learning device is configured to acquire a first image, reduce the first image to a second image having lower resolution than the first image, enlarge the second image to a third image having the same resolution as the first image, extract a first feature that is a feature of the first image and a second feature, convert the second feature into a third feature, and learn a feature conversion method based on a result of comparing the first feature with the third feature.


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